Accreditations
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X-ray Diffraction
Please Note: At
this time X-ray Diffraction is not available due to the high costs of
the instrument.
Identification
of crystalline compounds present in virtually
any material by reference to a computerized data file containing over
40,000
compounds.
Identification
of
asbestos and tremolite in talc.
Quantitative
analysis of
membrane filters for silica,
vanadium
oxide, zinc oxide, etc.
Identification of
materials
having the same chemical
formula
but different crystal structures and physical properties, for example,
different forms of SiO2, TiO2,
CaCO3,
iron oxides, Al2O3, etc.
Identification of
clays,
corrosion products, and other
materials too fine for microscopic identification.
Non-destructive
analysisof
powders, thin films, and
certain
other materials in amounts as small as one milligram.
Quantitative
analysis of
compounds with suitable
standards
NIOSH methods for
workplace
exposure monitoring.
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