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         Accreditations
                 
:: AIHA
:: NVLAP PLM
:: NVLAP TEM
:: CA DOHS ELAP




Transmission and Scanning Electron Microscopy

EMS Laboratories has been providing electron microscopy services since 1968, and the principal investigator has over 40 years experience in the analysis of materials by TEM.  For materials analysis EMS can provide:
Electron diffraction of crystalline structures.
Energy dispersive x-ray analysis for chemical composition.

Applications of TEM:

        Particle Analysis
Asbestos (air, water, soils, sediments, tissues)
Pigment
Aerosols
Catalytic materials
Oxides (magnetic tape)
Ceramics
Airborne particles       
Size, Distribution and Crystalline Forms
Wear Studies       
Corrosion Characterization
Morphological Studies
Thin Film Studies of Oxides
Epitaxial films
Magnetic materials
Scanning electron microscope (SEM) is used most frequently to image directly specimen surfaces.  The SEM is capable of high resolution and high magnifications with great depth of field.

Energy dispersive X-ray spectroscopy (EDX) combined with the SEM makes a powerful tool using electron beam microanalysis in the elemental analysis of minute volumes.  This method enables the identification of elements of atomic weight greater than fluorine with a high degree of accuracy as well as quantitative elemental analysis.

SEM and EDX studies include:

         Morphology and surface topography
         Metallurgical failure analysis
         Corrosion
         Electroplating processes
         Thin films
         Geological samples
         Particles analysis


  EMS LABORATORIES / 117 W. Bellevue Dr. / Pasadena, CA  91105-2503 / (626) 568-4065 / (800) 675-5777 / Fax (626) 796-5282